CALIBRATION METHOD FOR A MEASURING SYSTEM

专利名称：CALIBRATION METHOD FOR A MEASURING

SYSTEM

发明人：METZLER, BERNHARD,WALSER,

BERND,AEBISCHER, BEAT

申请号：EP10728205.5申请日：20100624公开号：EP2448722A1公开日：20120509

摘要：The method involves performing calibration measurement (KM) of a calibrationmeasuring cycle (MZ) by a detection of calibration measuring data (KD). A calibrationparameter (KP) is determined based on the calibration measuring data. A calibrationmeasuring cycle is sub-divided into part-cycles (TZ1-TZ6) that are assigned to thecalibration measurement. The part-cycles are carried out in a positioning interval (Pa)under observation of a work cycle (Ta), so that the calibration measuring cycle isregulated by the positioning interval. Independent claims are also included for thefollowing: (1) a computer program product including a machine-readable medium forexecuting a method for calibrating a measuring system (2) a measuring system fordetermining a position of an object to be defined in a frame of a industrial robotcomprising a controlling unit.

申请人：LEICA GEOSYSTEMS AG

地址：Heinrich-Wild-Strasse 9435 Heerbrugg CH

国籍：CH

代理机构：Kaminski Harmann

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