专利名称:Semiconductor device with trench gate发明人:Tomoki Inoue,Koichi Sugiyama,Hideaki
Ninomiya,Tsuneo Ogura
申请号:US10345268申请日:20030116
公开号:US20030102486A1公开日:20030605
专利附图:
摘要:An IGBT has a p-emitter layer and p-base layer, which are arranged on bothsides of an n-base layer. A pair of main trenches are formed to extend through the p-base layer and reach the n-base layer. In a current path region interposed between the
main trenches, a pair of n-emitter layers are formed on the surface of the p-base layer. Anarrowing trench is formed to extend through the p-base layer and reach the n-baselayer. The narrowing trench narrows a hole flow path formed from the n-base layer tothe emitter electrode through the p-base layer, thereby increasing the hole currentresistance.
申请人:INOUE TOMOKI,SUGIYAMA KOICHI,NINOMIYA HIDEAKI,OGURA TSUNEO
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