Integrated circuit and method for automatically tu

专利名称：Integrated circuit and method for

automatically tuning process andtemperature variations

发明人：Sung-jae Jung,Sang-yoon Jeon申请号：US114379申请日：20060522

公开号：US20070090870A1公开日：20070426

专利附图：

摘要：Provided are an IC and a method for automatically tuning process andtemperature variations. The IC includes: a test circuit unit including test circuit elements

having identical element values and variations to a tuning-targeted circuit element and atleast one reference circuit element having a smaller variation than the tuning-targetedcircuit element; a comparator that obtains a difference between intensities of first andsecond signals detected from the test circuit unit; and a tuning unit that tunes thevariation of the tuning-targeted circuit element according to the difference between theintensities of the first and second signals. Thus, process and temperature variations of acircuit element can be detected and accurately tuned with respect to the circuit elementitself. Also, the process and temperature variations can be tuned inside an IC. Thus, thetime required for tuning the process and temperature variations can be reduced.

申请人：Sung-jae Jung,Sang-yoon Jeon

地址：Seoul KR,Seoul KR

国籍：KR,KR

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