专利名称:ERROR DETECTION DEVICE发明人:HASHIMOTO, Daichi,NAKAZAWA,
Takashi,SEKINO, Haruhito
申请号:EP15855470.9申请日:20151023公开号:EP3214452A1公开日:20170906
专利附图:
摘要:An abnormality detection device includes: a coupling-capacitor having a first-endand a second-end coupled with a high-voltage circuit; a signal output unit; a signalextraction unit; and a signal input unit. The signal output unit is coupled with the first-end
of the coupling-capacitor via a detection-resistor, and outputs an alternating-currentinspection-signal. The signal extraction unit extracts the inspection-signal, as an
extraction-signal, output between the detection-resistor and the coupling-capacitor. Thesignal input unit detects abnormality of insulation resistance of the high-voltage circuitbased on a level of the inputted extraction-signal. The signal extraction unit includes asignal removing filter and a subtraction circuit. The filter removes a signal equal infrequency to the inspection-signal and passes low-frequency noises lower in frequencythan the inspection-signal. The subtraction circuit outputs a differential signal, as theextraction-signal, between a signal having passed through the filter and a signal nothaving passed through the filter.
申请人:Panasonic Intellectual Property Management Co., Ltd.
地址:1-61, Shiromi 2-chome Chuo-ku Osaka-shi, Osaka 540-6207 JP
国籍:JP
代理机构:Schwabe - Sandmair - Marx
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