INTEGRATED CIRCUIT INCLUDING OVERLAPPING SCAN DOMA

专利名称：INTEGRATED CIRCUIT INCLUDING

OVERLAPPING SCAN DOMAINS

发明人：Roy Menahem Shor,Asher Berkovitz,Shlomi

Sde-Paz

申请号：US14747924申请日：20150623

公开号：US20160377676A1公开日：20161229

专利附图：

摘要：An integrated circuit includes overlapping scan domains, wherein at least onescan domain of the integrated circuit includes some, but not all, of the synchronous logic

elements, logic gates, and signal paths of a different scan domain. Each scan domainincludes a scan wrapper to receive test patterns generated to test the logic mix for thatdomain. The test patterns are propagated through the logic mix of the scan domain togenerate corresponding output patterns, which are compared to expected results forthat scan domain. By overlapping the scan domains, test coverage of the integratedcircuit can be increased without substantially increasing testing time. The test patternsapplied to the integrated circuit can be pruned to remove duplicate patterns generatedfor overlapping scan domains.

申请人：Freescale Semiconductor, Inc.

地址：Austin TX US

国籍：US

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